Characterization of Metallic Nanowires by Combining Atomic Force Microscope (AFM) and Scanning Electron Microscope (SEM)

A new experimental method is introduced in order to characterize the mechanical properties of metallic nanowires. An accurate mechanical characterization of nanowires requires simultaneous imaging using scanning electron microscope (SEM) and mechanical testing with an atomic force microscope (AFM). In this study, an AFM is located inside an SEM chamber in order to establish the visibility of the nanowires. The tip of the AFM cantilever is utilized to bend and break the nanowires. Nanowire specimens are prepared by electroplating of metal ions into the nano-pores of the alumina membranes. Mechanical properties are extracted by using existing analytical formulations along with the experimental force versus bending displacement response. Preliminary results revealed that copper nanowires have unique mechanical properties compared to their bulk counterparts.